Transformice map database full#

Up to 3x as fast as the OmniScan MX2 flaw detector (max pulse repetition frequency).

Transformice map database full#

Slide Left: Using a full 64-element aperture (5L64-A32 probe), the OmniScan X3 64 flaw detector provides better PA resolution at the focal point, enabling you to more easily distinguish indications that are close together or in a cluster. Slide Right: Acquired using a 32-channel OmniScan X3 unit with a 64-element probe (5L64-A32 model), this S-scan is a high-quality image but the resolution reflects the fact that only the middle 32 elements could be used for the focal law. Users who own or trained on an OmniScan will transition easily to the OmniScan X3 flaw detector, and new users will find it easy to learn.Įxploit the full potential of 64-element phased array probes using the OmniScan X3 64 flaw detector to achieve improved resolution at the focal point. Perform multigroup calibrations in minutes.įamiliar Yet Improved OmniScan Experience The OmniScan X3 calibrator tracks the signals at high speed. The X3 Remote Collaboration Service (X3 RCS) enables you to share your screen, allow a remote collaborator to control the unit, and host a video conference with participants located almost anywhere in the world. Virtual Collaboration, Virtually Anywhere Available on the OmniScan X3 64 flaw detector as of MXU 5.10. Our innovative amplitude-free live phase coherence imaging (PCI) improves small-defect sensitivity and penetration in noisy materials, all while easing your setup and simplifying sizing. The AIM tool takes the guesswork out of creating your scan plan-visualize the effect of a wave set (TFM mode), see where sensitivity stops, and adjust your scan plan accordingly. The Acoustic Influence Map (AIM) tool provides you with an instant visual model of the sensitivity based on your TFM mode, probe, settings, and simulated reflector. Powerful tools, including total focusing method (TFM) imaging and advanced visualization capabilities, backed by its high image quality enable you to complete your inspection with greater confidence.Ĭonfirm Your TFM Beam Coverage in Advance The OmniScan X3 flaw detector is a complete phased array toolbox. Consultation Reception about Introduction.OEM Microscope Components for Integration.Semiconductor & Flat Panel Display Inspection Microscopes ▾.Aerospace/Wind Blade Inspection Scanners.

Flaw Detectors / Phased Array Flaw Detectors ▾.Thickness and Flaw Inspection Solutions ▾.